TOPICS & PARALLEL EVENTS

IMEKO-TC 4 Symposium

The Symposium is the ideal place for the presentation of new ideas, methods, principles, instruments, standards and industrial applications on electric and magnetic quantities as well as their diffusion across the scientific community. Participants will have an excellent opportunity to exchange scientific and technical information with specialists around the world and to enhance their international co-operation. The topics are:

1. Direct Current and Low Frequency Measurements
2. Radio Frequency, Microwave and Millimeter Wave Measurements
3. Optical Wavelength Metrology
4. Calibration, Metrology and Standards
5. Traceability and International Compatibility of Measurements
6. Advanced Instrumentation Based on Micro and Nano Technologies
7. Digital and Mixed Signal Processing
8. Waveform Analysis and Measurement
9. Software Measurements
10. Biomedical Measurements
11. Dielectric Measurements
12. Power and Energy Measurements
13. Power Quality Assessment
14. Time and Frequency Measurements
15. Automated Test and Measurement Systems
16. Sensors and Transducers
17. Measurement for System Identification and Control
18. Virtual Measurement Systems
19. E-learning and Education in Measurements and Instrumentation

IMEKO TC 4-TC21 Parallel Session

• In the IMEKO TC4 Symposium a joint session is also organized with IMEKO TC21

IWADC International Workshop on ADC Modelling and Testing

IMEKO TC-4 Working Group on Analogue-to-Digital & Digital-to-Analogue Converter Metrology serves as a forum for users, developers, and researchers involved in researches on ADCs and DACs, under IMEKO Technical Committee on Measurement of Electrical Quantities. This forum allows coming together partners dealing with all problems concerning: ADC and DAC modelling, testing, specifications, data correction and interfaces. The corresponding topics concern:

1.   AD&DA advanced techniques, circuits and application
  1.1.  Very fast ADC
  1.2.  Band pass ΣΔ ADC
  1.3.  ΣΔ ADC for general application
  1.4.   DAC - new principle & application
  1.5.   Auxiliary circuits for ADC

2.    ADC modelling and testing
  2.1.  ADC standardisation
  2.2.  ADC testing
  2.3.  Resolution increase & autocorrection
  2.4.  ADC/DAC modelling

IWADC Parallel Events

• PRIN 2006 “DEVELOPMENT OF NEW METHODS FOR THE CHARACTERIZATION, MODELING AND CORRECTION OF A/D AND D/A CONVERSION NOT IDEALITY, TO CONTRIBUTE TO THE HARMONIZATION AND THE UPGRADE OF THE RELATIVE INTERNATIONAL STANDARDS” results will be organised.